NEXCOPE NX1000

INDUSTRIAL INSPECTION MICROSCOPE

NX1000, 12 inch Inspection Microscope for Microelectronics , Semiconductor and wafer

  • Using NIS45 infinity corrected optical system, it has excellent optical qualities such as long working distance, strong chromatic aberration correction ability and sharp imaging.
  • Specially designed for industrial wide-area observation needs, using a 12-inch super-wide stage to meet FPD and LSI tests simultaneously, adding motorized components such as large platform arms and objective lens replacement; fatigue resulting from long-term microscopic operations.
  • By adopting a modular design, it can realize observation methods such as bright field, dark field, DIC, fluorescence and polarization. It is an ideal microscope for quality control and research of semiconductor devices, FPD, electronic devices, materials, precision molds.

NIS45 OBJECTİVE SERIES

By adopting multilayer coating technology, NIS45 series objective lens can compensate spherical aberration and the chromatic aberration from ultraviolet to near infrared.The sharpness, resolution and color rendition of the images can be guaranteed .The image with high-resolution and flat image for various magnifications can be got.

KOHLER LIGHTING

Perfect microscopic illumination system — Kohler illumination, provides bright and uniform illumination throughout the viewing field. Coordinated with infinity optical system NIS45, high NA and LWD objective , perfect microscopic imaging can be provided.

ERGONOMIC TILTING TRINOCULAR HEAD

The Ergo tilting viewing head can make the microobservation work more comfortable, so as to minimize the muscle tension and discomfort caused by long hours of work.

ERGONOMIC TABLE AND FOCUS CONTROL

The focusing mechanism and fine adjustment handle of stage adopt the low hand position design, which conforms to the ergonomic design, and gives the greatest degree of comfortable feeling.

MOTORIZED CONTROL

By setting specific knobs to specific objective lenses, you can easily change magnification with a single touch. It can also remember the illumination brightness for each objective lens in use and automatically adjust light intensity to reduce visual fatigue when switching between different objective lenses. The NX1000 intelligently adjusts the focusing speed of the objective turret via the rotation speed of the focusing handwheel and the focusing distance, ensuring faster and more accurate focusing.

CONTROL PANEL

The microscope control panel is located on the front of the microscope.

The control mechanism used for observation is located at the front of the microscope (next to the operator) and makes operating the microscope faster and more comfortable when observing samples. It can also reduce fatigue caused by long-term observations and suspended dust caused by large movements.

LARGE WORK TABLE

As the areas of microelectronic and semiconductor samples expand, ordinary metallographic microscope tables become unable to meet observation needs. NX1000 has a large table with a wide range of motion, which is convenient and easy to transport. This makes it an ideal tool for microscopic observation of large-area industrial samples.

ANTI-STATIC PROTECTIVE PLATE

Industrial samples should be kept away from floating dust, as even a small dust can affect product quality and test results. The NX1000 comes with a wide range of anti-static protective covers to protect samples as much as possible from corrosive dust and fallout, making test results more accurate.

LONGER WORKING DISTANCE                          

LONGER APERTURE OPENNESS

All types of electronic component, semiconductor and circuit board samples result in significant height differences. Therefore this microscope adopts a special objective lens with long working distance. Meanwhile, in order to meet the high requirements for color reproduction of industrial samples, multilayer coating technology has been developed and improved over the years, high aperture apochromatic objective lenses have been adopted, which can restore the true color of the sample.

VARIOUS OBSERVATION METHODS FOR DIFFERENT TESTING REQUIREMENTS

The NX1000 scientific-grade microscope can perform a variety of observation methods through modular combinations of brightfield, darkfield, phase contrast, fluorescence, polarization, and DIC.

RADIATION BRIGHT FIELD

Excellent NIS NX1000 adopt wireless optical system.Field even, bright, color reduction degree is high.Suitable for observation, such as semiconductors,opaque samples.

DARK FIELD

Can achieve bright dark field observation, the defects such as minor  scratches can be highly sensitive test. For the high demand of the surface of the sample for testing.

TRANSMITTION BRIGHT FIELD

For transparent samples, such as FPD, optical components, etc., can be achieved by projecting light condenser field observation. At the same time also can with DIC, the simple use of polarization and other accessories.

SIMPLE POLARIZATION

The observation method is suitable for specimens with characteristics of birefringence, such as microstructure, mineral, LCD and semiconductor materials.

DROP SHOT DIC

Small differences in precision mould used for observation.This observation technique can be ordinary observation without see small height difference method, with relief and expressed in the form of a 3D image.

PANAROMIC IMAGE COMPOSITION

can quickly combine small images to create large, high-resolution images.

REAL-TIME/STATIC MEASUREMENTS

General observation and quality control require interactive measurement functions such as distance, angle, rectangle, circle and ellipse.

REAL-TIME HDR IMAGE

When observing different samples, high contrast areas can be seen on the sample surface. HDR allows users to create perfectly exposed images.

DEPTH FUSION / 3D REPORTING

NEXCOPE NX1000 provides depth fusion and 3D reconstruction capabilities.