NEXCOPE NM900

INDUSTRIAL RESEARCH MICROSCOPE

NEXCOPE NM900 is Designed for Unlimited Microscopy

The NM900 Series is modularly designed to meet a variety of industrial and materials science applications.

This gives users the flexibility to create a system that suits their specific needs.

The mechanical structure is sturdy and compact, with ergonomic design, reasonable layout and convenient operation. The user can operate the microscope in a natural posture.

Adopting NIS infinity corrected optical system, this device has excellent optical qualities such as long working distance, high color reproduction and accurate imaging, providing high contrast, clear and bright images.

Bright field, dark field, DIC, fluorescence, polarization etc. It adopts modular design to realize observation methods. It is an ideal tool for quality control and research of semiconductor devices, FPD, electronic devices, materials and precision mold manufacturing.

INTUITIVE MICROSCOPE CONTROL

ALL IN ONE CONTROL PANEL

Once specific buttons are set for specific lenses, you can easily change magnification with a single tap.

MOTORIZED LENS TURRET

The motorized turret memorizes the light intensity for each lens, the desired 2 lenses can be assigned to the buttons on the right, and switching between the 2 lenses can be easily done without removing the eyes from the eyepiece.

ECO MODE

The microscope automatically turns off the light source 30 minutes after the user leaves the microscope. This energy-saving system preserves the life of light sources.

ERGONOMIC TRINOCULAR HEAD

It eliminates neck and back pain problems during intensive microscope use.

NIS SERIES OBJECTIVE LENS

Color accuracy is critical for accurate and effective inspection. NIS45 series lenses use carefully selected high transmittance glass and advanced coating technology to accurately reproduce natural colors. Additionally, the entire optical system, including the lens barrel, is designed to reproduce natural colors; This ensures sharp images that remain faithful to exemplary colours, especially for digital imaging.

DIC CONTRAST SYSTEM

The newly developed DICR differential interference component can convert subtle height differences undetectable in bright-field observation into high contrast and display them in the form of a three-dimensional relief like an LCD conductor.

DARK FIELD OBSERVATION

The dark area allows the user to observe light scattered and refracted from the sample. The light from the source passes through a circular optical illumination device and is then focused on the sample. Because they are created with reflection in the Z axis only, users can observe scratches and defects as small as 8 nm, beyond the resolution limit of optical microscopes. You can check smooth surface samples including wafer.

UNDERLIGHTING OBSERVATION

A type of transmission-focus focusing mirror for transparent samples realizes the actual transmitted light observation. Using underlighting, you can view and examine samples in brightfield, darkfield, DIC, and polarized light. All in one convenient system.

POLARIZATION OBSERVATION

The polarization used in this microscopy technique is It is produced by a series of filters (polarizer and analyzer) and the sample properties directly affect the intensity of reflected light in the system. Observe metal structures (e.g., graphite growth patterns in spheroidal iron), minerals, LCDs, and semiconductor materials.

DIC DIFFERENTIAL INTERFERENCE CONTRAST

DIC is a microscopy technique that measures height differences and presents them as three-dimensional images with relief or increased contrast. It is based on polarization technology. Specially designed prisms are available to meet your needs. This method is suitable for the detection of samples with very low height differences, including metallurgy, minerals, head grinding surfaces and hard disk surfaces, and crystallized surfaces