NEXCOPE NX600

INDUSTRIAL INSPECTION MICROSCOPE

NX600, 6-inch Platform  Inspection Microscope for Microelectronics , Semiconductor and wafer

• Using NIS45 infinity corrected optical system, it has excellent optical qualities such as long working distance, strong chromatic aberration correction ability and sharp imaging.
• By adopting a modular design, it can realize observation methods such as bright field, dark field, DIC, fluorescence and polarization. It is an ideal microscope for quality control and research of semiconductor devices, FPD, electronic devices, materials, precision molds.

NIS45 OBJECTİVE SERIES

By adopting multilayer coating technology, NIS45 series objective lens can compensate spherical aberration and the chromatic aberration from ultraviolet to near infrared.The sharpness, resolution and color rendition of the images can be guaranteed .The image with high-resolution and flat image for various magnifications can be got.

KOHLER LIGHTING

Perfect microscopic illumination system — Kohler illumination, provides bright and uniform illumination throughout the viewing field. Coordinated with infinity optical system NIS45, high NA and LWD objective , perfect microscopic imaging can be provided.

LARGE WORK TABLE 

The NX600 is equipped with 6-inch platforms and has a wide variety of stage add-ons to choose from. These add-ons are suitable for wafers 150 mm and below, as well as larger FPD samples. The adjustable stage arm and movable stage arm with built-in grip facilitate rapid sample positioning.

ERGONOMIC TABLE AND FOCUS CONTROL

The focus and stage X-Y adjustment mechanism adopts a low-hand design that conforms to ergonomics and provides superior comfort.

MICROSCOPE CONTROL SCREEN

The LCD screen on the front of the microscope displays the microscope's status, including magnification, light intensity, color temperature, and light source selection. Both the transmitted and reflected light sources are connected to a multifunctional rotating turret, unlike traditional knobs.

LONGER WORKING DISTANCE                         

LONGER APERTURE OPENING

All types of electronic component, semiconductor and circuit board samples result in significant height differences. Therefore this microscope adopts a special objective lens with long working distance. Meanwhile, in order to meet the high requirements for color reproduction of industrial samples, multilayer coating technology has been developed and improved over the years, high aperture apochromatic objective lenses have been adopted, which can restore the true color of the sample.

COLORS CLOSEST TO THE ORIGINAL

The NX Series is available with an optional LED light source. LED illumination provides a constant color temperature and true-color imaging. LED's long lifespan, low power consumption, and easy maintenance make it an ideal microscope light source.

BRIGHTNESS MEMORY FUNCTION

It can memorize the illumination and brightness of each lens. When the objective lenses are changed, the light intensity is automatically adjusted, reducing visual fatigue and expanding different working areas.

VARIOUS OBSERVATION METHODS FOR DIFFERENT TESTING REQUIREMENTS

The NX600 scientific-grade microscope can perform a variety of observation methods through modular combinations of brightfield, darkfield, phase contrast, fluorescence, polarization, and DIC.

RADIATION BRIGHT FIELD

Excellent NIS NX800 adopt wireless optical system.Field even, bright, color reduction degree is high.Suitable for observation, such as semiconductors,opaque samples.

DARK FIELD

Can achieve bright dark field observation, the defects such as minor  scratches can be highly sensitive test. For the high demand of the surface of the sample for testing.

TRANSMITTION BRIGHT FIELD

For transparent samples, such as FPD, optical components, etc., can be achieved by projecting light condenser field observation. At the same time also can with DIC, the simple use of polarization and other accessories.

SIMPLE POLARIZATION

The observation method is suitable for specimens with characteristics of birefringence, such as microstructure, mineral, LCD and semiconductor materials.

DROP SHOT DIC

Small differences in precision mould used for observation.This observation technique can be ordinary observation without see small height difference method, with relief and expressed in the form of a 3D image.

PANAROMIC IMAGE COMPOSITION

can quickly combine small images to create large, high-resolution images.

REAL-TIME/STATIC MEASUREMENTS

General observation and quality control require interactive measurement functions such as distance, angle, rectangle, circle and ellipse.

REAL-TIME HDR IMAGE

When observing different samples, high contrast areas can be seen on the sample surface. HDR allows users to create perfectly exposed images.

DEPTH FUSION / 3D REPORTING

NEXCOPE NX1000 provides depth fusion and 3D reconstruction capabilities.