NEXCOPE NX2000

INDUSTRIAL INSPECTION MICROSCOPE

NX2000 , 12 inch Motorized Wafer Inspection Microscope for Microelectronics and Semiconductor

  • Extra wide loading platform and wide range of motion, easy movement and focusing, sample range is detected quickly. It is an ideal tool for microscopic observation of large-area industrial samples.
  • Whether it is a very small sensor, a large plate, or even an entire LCD screen, you can use the NEXCOPE NX2000 industrial inspection microscope to observe.
  • It has a sample and objective lens protection mechanism to maximize the protection of fragile electrical component samples, also reducing subsequent microscope maintenance costs.

INTEGRATED CONTROL PANEL

NX2000 microscope control components adopt an innovative integrated design. Motorized coarse/fine focus adjustment, motorized objective turret, lower and upper light brightness adjustment knob and other control components are mounted on the front of the microscope. It inherits the excellent structure and layout of existing microscopes and enhances the convenience of electronic control to provide unparalleled ease of operation.

LARGE SAMPLE AREA

To meet the testing requirements of various fields of the LCD panel industry, NX2000 adopts large Z-axis travel ability of 200mm and is matched with large 14"x12 industrial platform, which can be perfectly adapted to various sizes. Test samples, microelectronics and semiconductor samples generally have large areas and ordinary metallurgical Microscope platforms cannot meet the observation needs. NX2000 has a large loading platform and wide movement range, and its movement is convenient and fast. It is an ideal tool for microscopic observation of samples.

NIS45 LENS SERIES

Using multilayer coating technology, spherical aberration and chromatic aberration can be corrected from ultraviolet to near infrared. Provides image clarity and color reproduction. Obtain high-resolution and flat images at any magnification. At the same time, the ultra-long working distance design perfectly solves the adaptability problem of irregular samples in industrial testing.

KOHLER LIGHTING

A complete microscope illumination system - Kohler illumination provides a bright, uniform field of view. The infinity optical system NIS45 and high numerical aperture and long working distance objectives provide excellent microscopic imaging.

ERGONOMIC TRINOCULAR HEAD 

You can operate the observation head in a more comfortable position with its adjustable tilt angle. It minimizes muscle tension and discomfort caused by working for long periods of time.

ERGONOMIC TABLE AND FOCUS CONTROL 

The focusing mechanism and the table X-Y adjustment mechanism adopt a low hand design that suits ergonomics and provides superior comfort.

VARIOUS OBSERVATION METHODS FOR DIFFERENT TESTING REQUIREMENTS

The NX2000 scientific-grade microscope can perform a variety of observation methods through modular combinations of brightfield, darkfield, phase contrast, fluorescence, polarization, and DIC.

RADIATION BRIGHT FIELD

Excellent NIS NX2000 adopt wireless optical system.Field even, bright, color reduction degree is high.Suitable for observation, such as semiconductors,opaque samples.

DARK FIELD

Can achieve bright dark field observation, the defects such as minor  scratches can be highly sensitive test. For the high demand of the surface of the sample for testing.

TRANSMITTION BRIGHT FIELD

For transparent samples, such as FPD, optical components, etc., can be achieved by projecting light condenser field observation. At the same time also can with DIC, the simple use of polarization and other accessories.

SIMPLE POLARIZATION

The observation method is suitable for specimens with characteristics of birefringence, such as microstructure, mineral, LCD and semiconductor materials.

DROP SHOT DIC

Small differences in precision mould used for observation.This observation technique can be ordinary observation without see small height difference method, with relief and expressed in the form of a 3D image.

IMAGE MOSAICING

Through real-time image acquisition or by importing images, edges can be quickly aligned and stitched together to form a large, high-resolution image.

REAL-TIME STATIC MEASUREMENT

Typical observation and quality control need interactive measurement functions, such as distance, Angle, rectangular circular and elliptical.

HIGH-DEFINITION REAL-TIME HDR IMAGE/VİDEO

During the observation of various specimens, surfaces often reveal high-contrast details. HDR technology ensures perfect exposure balance between shots, delivering fully detailed and clear images.

THE DEPTH OF FIELD FUSION

The depth fusion function delivers a crystal-clear, top-down image by seamlessly combining multiple focus layers into one sharp view.